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Nuclear & Space Radiation Effects Conference

Monday, July 20, 2020 - 8:00 am / Friday, July 24, 2020 - 5:00 pm CEST

blankThe conference features a technical program consisting of eight to ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short course on a radiation effects issue with current relevance offered on July 20, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions.

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

Paper on significant new findings in the following or related areas:

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single-Event Charge Collection Phenomena and Mechanisms
  • Radiation Transport, Energy Deposition and Dosimetry
  • Ionizing Radiation Effects
  • Materials and Device Effects
  • Displacement Damage
  • Processing-Induced Radiation Effects

 Radiation Effects on Electronic and Photonic Devices, Circuits and Systems

  • Single Event Effects, Total Dose and Displacement Damage
  • MOS, Bipolar and Advanced Technologies
  • Systems on Chip, GPUs, FPGAs, Microprocessors
  • Isolation Technologies, such as SOI and SOS
  • Methods for Hardened Design and Manufacturing
  • Modelling of Devices, Circuits and Systems
  • Cryogenic or High-Temperature Effects
  • Novel Device Structures, such as MEMS and Nanotechnologies
  • Techniques for Hardening Circuits and Systems

 Space, Atmospheric, and Terrestrial Radiation Effects 

  • Characterization and Modeling of Radiation Environments
  • Space Weather Events and Effects
  • Spacecraft Charging
  • Predicting and Verifying Soft Error Rates (SER)

 Hardness Assurance Technology and Testing

  • New Modeling and Testing Techniques, Guidelines and Hardness Assurance Methodology
  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods
  • Dosimetry

 New Developments of Interest to the Radiation Effects Community

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    Details

    Start:
    Monday, July 20, 2020 - 8:00 am CEST
    End:
    Friday, July 24, 2020 - 5:00 pm CEST
    Event Category:

    Organizer

    IEEE NPSS
    Website:
    https://ieee-npss.org/

    Venue

    Hilton Santa Fe Buffalo Thunder
    20 Buffalo Thunder Trail
    Santa Fe, NM NM 87506 United States
    + Google Map
    Phone:
    +1 505-455-5555
    Website:
    https://www3.hilton.com/en/hotels/new-mexico/hilton-santa-fe-buffalo-thunder-SFECGHH/index.html?SEO_id=GMB-HI-SFECGHH