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Radiation Test Workshop 2016
Thursday, March 31, 2016 - 8:00 am / Friday, April 1, 2016 - 5:00 pm CEST
We are please to announce
The RADECS Thematic Workshop: EEE Components Radiation Test
The radiation testing on EEE components is a key recurrent activity, routinely performed during the parts procurement and evaluation, but under continuous discussions due to a series of factors:
- Lack of standards, or not sufficiently harmonized requirements for some radiation effects.
- Frequent problems: test lead time and cost, radiation source availability, test results correlation, identification of device failures modes, …, etc.
- New challenges: knowledge of new technologies radiation behaviour (CSi, GaN, SiGe,…), higher device complexity, difficulties derived from lower device technology visibility, etc.
In order to have the opportunity to discuss all these topics, a thematic workshop will take place next 31st March and 1st April 2016, in Seville, Spain.
The presentations will be delivered by industry recognized experts. A roundtable discussion will take place to review the presented topics.
Please follow the workshop web site for updates and further information for authors, exhibitors and sponsors.