Acceptance tests Evaluation / Qualification Failure analysis Internal Visual Inspection Electronic Components | EEE Parts by David Ramirez - Cruzado
Scanning Acoustic Microscopy C-SAM C-SAM Inspection of Microelectronic parts by Francisco Javier Aparicio Rebollo
Scanning Acoustic Microscopy C-SAM Non-destructive internal inspection of EEE parts and passive components by Francisco Javier Aparicio Rebollo
Acceptance tests Counterfeit detection Evaluation / Qualification Failure analysis Relifing Resistance to Solvent or Marking Permanence Test | EEE Parts by Jesús Enrique Barbero Muñoz