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August 20, 2017
element evaluation eee parts

Element Evaluation Procedure EEE Parts

Media ATN
August 20, 2017
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The scope of Element Evaluation is to assess the reliability of a individual device to be used as add-on component in an hybrid assembly. Element Evaluation cover electrical, physical and environmental (depending of required class level) performance of the add-on components to guarantee the space use of the tested devices.
November 23, 2016
silicon capacitors space

SILICON CAPACITORS SPACE Pre-Evaluation | Alter Technology

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November 23, 2016
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New space missions include more extreme requirements of storage and operational temperatures and vacuum conditions exceeding standard -55ºC / +125ºC conditions Miniaturization implies increase higher power dissipation and hence max junction and PCB temperatures.
November 14, 2016
cots use in space

COTS / EEE parts in space applications: evolution overview.

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November 14, 2016
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For decades, military/space electrical, electronic, and electromechanical (EEE) parts have proved to be suitable for use in military and space applications. [NASA's Office of Safety & Mission Assurance (OSMA) evaluates newly available and advanced electronic parts for programs and projects under its EEE Parts program.]
October 13, 2016
asic validation

validation ASIC Space Applications

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October 13, 2016
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Traditionally ASICs (and FPGAs) used in space were manufactured using Rad-Hard technologies and designed with special libraries. AS CMOS Technologies became denser (beyond the 180 nm node) it was realized that it was no longer affordable to change the semiconductor technology and that hardening had to be assured by other means. ç With DSM , access to the technology has become even harder for space users. As a result, today, in many cases (specially for smaller users) each box in the design flow below is assured by a different entity. ALTER has implemented an independent global solution which takes over right after foundry.
August 31, 2016
Liquid Crystals in Space Photonics

Reliability of Liquid Crystals in Space Photonics

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August 31, 2016
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Reliability of Liquid Crystals in Space Photonics Preview: Eva Otón, Javier Pérez, Demetrio López, Xabier Quintana, José M. Otón, and Morten A. Geday CEMDATIC, ETSI Telecomunicación, Universidad Politécnica de Madrid, Spain Alter Technology, Spain Abstract: Passive liquid crystal (LC) devices are becoming an interesting alternative for the manufacturing of photonic devices in spatial applications. These […]
April 8, 2016
TID DD reliability prediction method

A method of space radiation environment reliability prediction

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April 8, 2016
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A method of space radiation environment reliability prediction • Space radiation environment is an important failure causing factor in space vehicles. • Traditional reliability prediction method did not include the space radiation environment reliability. • It’s the time to set up a method of space radiation environment reliability prediction. Play the Video PAPER or download […]
April 8, 2016
tlisde

Russian SEE test approach

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April 8, 2016
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Russian SEE test approach: available standards, test variables, difficulties and future trends Play the Video PAPER or download the presentation. Speaker: Pavel Chubunov, Head of Department Branch of URSC – ISDE  
April 8, 2016
airbus

Experience on SEE testing of EEE parts

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April 8, 2016
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Experience on SEE testing of EEE parts (Memories, RF Power devices, etc.) Play the Video PAPER or download the presentation. Speakers: Christian Binois (ADS) Mirko Rostewitz (TESAT) TSOEF1 -EEE Parts Engineering & Radiation
March 30, 2016
thales

SEE testing on GaAs test vehicles. Methodology, Results and Derating. Lessons Learned

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March 30, 2016
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SEE testing on GaAs test vehicles. Methodology, Results and Derating. Lessons Learned Talk summary: Radiation sensitivity of GaAs components is not really well known, compare to other technologies. Traditional radiation harness policy consisted in a good derating in DC bias conditions to ensure operation inside a known or expected DC safe operating area (SOA). However […]
March 29, 2016

How approach a heavy ions test using SiC power devices – Radiation Testing

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March 29, 2016
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Radiation Testing – How approach a heavy ions test on a new device technology using SiC power devices as an example Talk summary: New failure modes not observed in Silicon appear while testing SiC MOSFET and Schottky diodes and under heavy ions radiation. Gate damage in transistors remains undetected even monitoring drain current and gate […]
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