Scanning Acoustic Microscopy C-SAM Non-destructive internal inspection of EEE parts and passive components by Francisco Javier Aparicio Rebollo
Evaluation / Qualification Material Processes Raman Thermometry | Hi Rel Electronics Parts by Francisco Javier Aparicio Rebollo
Papers Vibration Testing Electronic Devices Assessment of Commercial Optical Amplifiers for Potential use in Space Applications by Juan Barbero
Climatic Tests Environmental testing ATN Industry | Security Vibration Testing Electronic Devices Environmental Tests by Media ATN