El objetivo de este estudio es apoyar el desarrollo de un MOSFET europeo discreto de potencia de SiC endurecido a la radiación para su uso en aplicaciones espaciales mediante el estudio del óxido de puerta en términos de SEE y TID como uno de los parámetros clave en el futuro...
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Los aceleradores son el método aceptado para validar un dispositivo para volar. Las pruebas in vivo son una tarea compleja y costosa que se necesita para obtener información sobre cómo las fallas pueden propagarse a los productos primarios y monitorear que la respuesta de un...
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Radiation sensitivity of GaAs components is not really well known, compare to other technologies. Traditional radiation harness policy consisted in a good derating in DC bias conditions to ensure operation inside a known or expected DC safe operating area (SOA). However...
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Space is a harsh environment due to vacuum, UV, temperature, vibration and radiation…etc. Before landing a space vehicle, devices and materials have to be tested at ground level in order to estimate the effect of all these parameters to know about irradiators. This is why, it is...
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The Total Ionizing Dose (TID) radiation test on EEE parts involves a number of variables and processes which must be kept under control to ensure correct test execution and compliance with the used test method. From the test plan definition to the test report issue, proper...
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The radiation hardness of modern electronic devices regarding the space radiation environment is characterized according to two main aspects: cumulated effects and single event effects. The parts radiation qualification process includes Total Ionizing Dose (TID), Total Non...
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A new issue (issue 5) of ESCC22900 TID test standard will be released this year. The changes will be presented. Then, study results about part to part and lot to lot TID sensitivity ariability on bipolar linear devices will be presented. Impact on sample size and testing...
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VA160 and VATA160 are used as front-end readout ASICs in the payloads of DAMPE. Both Laser pulse test and heavy ion beam test were conducted to get the SEL tolerance of the ASICs. Laser test was performed firstly to quality the SEL sensitivity because it is easy and ready at all...