The Reliability Assessment of Area PIN SI Photodiodes was a exhibition theme in the First International Symposium on Reliability of Optoelectronics for Space that took place in Cagliari Italy , between May 11 – 14, 2009. INTA, the Instituto nacional de Técnica Aeroespacial in...
The Single event effects is becoming more and more important due to the devices technology evolution, the increase demand of COTS use (and other non characterized devices against radiation), and the radiation requirements request by new missions and applications. In this paper...
HCP306HV hot/cold plate of 150mm x 150mm dimensions LN2 pumping system w/10L LN2 dewar to be used as a portable system mK1000U temperature controller unit with a temperature range of -100°C to +200ºC Vacuum chamber allowing vacuum conditions of 1E-3mbar with lid cover and 100mm...
Electromagnetic compatibility testing in accordance with the MIL-STD-461 E/F, MIL-STD-461, EN 61326-1, Safety testing in accordance with EN 61010-1 and Environmental testing in accordance with MIL-STD-810 F/G/G.
Technical Program All the Papers are available to download following the links. 31 st March 9’00 Joaquin Gómez Camacho, Director Centro Nacional de Aceleradores (CNA) Jose Guadix, Director General of Technology Transfer, University of Seville (USE). Miguel Ferrer...
