A new issue (issue 5) of ESCC22900 TID test standard will be released this year. The changes will be presented. Then, study results about part to part and lot to lot TID sensitivity ariability on bipolar linear devices will be presented. Impact on sample size and testing...
The radiation hardness of modern electronic devices regarding the space radiation environment is characterized according to two main aspects: cumulated effects and single event effects. The parts radiation qualification process includes Total Ionizing Dose (TID), Total Non...
The Aerospace and Electronic Businees Unit is part of the Hirex Engineering, one of the Companies within the Alter Technology, owned by TÜV NORD. This engineer service, focus in radiation in electronic devices, shows a Test Vehicle TID. In order to advance the report, a few...
The Total Ionizing Dose (TID) radiation test on EEE parts involves a number of variables and processes which must be kept under control to ensure correct test execution and compliance with the used test method. From the test plan definition to the test report issue, proper...
Given a general introduction on testing optical materials for use in radiation environments. A special emphasis is given to thin optical coatings, optical fibers, and fiber Bragg gratings. Here the test procedures are much more challenging than for bulk materials. The challenges...
Space is a harsh environment due to vacuum, UV, temperature, vibration and radiation…etc. Before landing a space vehicle, devices and materials have to be tested at ground level in order to estimate the effect of all these parameters to know about irradiators. This is why, it is...
The Reliability Assessment of Area PIN SI Photodiodes was a exhibition theme in the First International Symposium on Reliability of Optoelectronics for Space that took place in Cagliari Italy , between May 11 – 14, 2009. INTA, the Instituto nacional de Técnica Aeroespacial in...
