Non-destructive detection of micrometric internal features within EEE microelectronic systems.
Francisco Javier Aparicio Rebollo
September 3, 2019
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Confocal Acoustic Inspection of Optoelectronic Components
Francisco Javier Aparicio Rebollo
July 3, 2019
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Scanning Acoustic Microscopy on Ceramic Capacitors
Francisco Javier Aparicio Rebollo
May 18, 2020
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Acoustic Inspection of Hybrid Systems on Laminated Substrates
Francisco Javier Aparicio Rebollo
September 3, 2019
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Water ingress through delaminated parts in plastic encapsulated systems
Francisco Javier Aparicio Rebollo
July 25, 2019
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Inspection of thick EEE plastic encapsulated parts
Francisco Javier Aparicio Rebollo
June 26, 2019
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