Experience on SEE testing of EEE parts

Experience on SEE testing EEE parts (Memories, RF Power devices…)

Many basic testers availables which offer the capability to carry out a test in a rather short delay (a few weeks) at a relatively low cost.
Capability to develop on demand test setup for complex devices (μP High frequency devices, RF fixtures etc…) higher cost driven by the test preparation effort.
Access to many facilities, selection is based on more than 15 years of experience .
In house device opening capability especially for plastic packages more and more difficult.
Good electronics skills are mandatory for test setup development as well as a good knowledge of the tested device.

Wacth full presentation online here

Speakers:

Christian Binois (ADS) Mirko Rostewitz (TESAT) TSOEF1 -EEE Parts Engineering & Radiation

AIRBUS DS Test Activity Overview

More than 600 tests since 2003.
Mainly dedicated to provide SEE behaviour of EEE devices used by any ADS project.
Fully integrated within the procurment process at early level, traceability (man lot, factory etc…) avoid a huge number of tests.
Some internal R&D activities as well as some funded by ESA, CNES and DLR.
Support on request to external customers (mainly on ADS related projects).

Test benches

Generic test benches used for more than 90% of devices

4 test slots
Board compliant with all facilities.
Many remotely programmed analog and digital I/O
High speed digitizers for SET
Ability to test SEU, SET and SEL separately or at the same time depending on the device
Ability to test Opamps, comparators, voltage ref and regulator, DAC, ADC and the most current digital circuits (line buffer, latches etc…)
Ease of daughter board design (a few days)
Capability to change quickly test conditions during test
Autotest to check device and tester good healt

8 test slots
Can hold P or N channel up to 600V Vds and +/-100V Vgs
On line measurement of Igss (10pA to 100mA) and Idss
SEB detection and Drain charge collection integrated acquisitions
Integrated VGSth measurement for N channel (P to be added)
Integrated PIGST capability
Fully Remote controlled operation
Integrated autotest to check device connection and tester integrity before irradiation ( a not connected device is seen unsensitive )

8 test slots
Up to 1100V VR (design limit 7.5kV)
Temperature monitoring with heating option
On line measurement of Ir(10pA to 20mA)
Remote controlled operation
Integrated autotest to check device and tester integrity before irradiation ( a not connected device is seen unsensitive )

40 MHz asynchronous mode & 20 MHz synchronous DDR mode
2 adjustable protected supplies (SEL) with on line voltage and current monitoring
Embedded Processor under Linux RT and FPGA
Remote controlled operation through single ethernet link
Integrated hard drive for high speed data recording (many Gbytes of data during test)
User defined test sequence up to 2000 cmd/s

One shot test benches

MUXDAC

SET detection with High Frequency dynamic signals, (400MHz with 3GHz carrier ) no Scope trigger usable —dedicated analog trigger designed
4 output modes

SCOC3 ASIC

RF SEE Testing

E.g. “Qualification of GaN Power Bars for BIOMASS” with the ESA contract No. 4000110760/14/NL/CT
15 and 80 W RF GaN power devices from UMS

In-air facility is needed due to the high heat dissipation
• KVI – center of advanced radiation technology at the University of Groningen (The Netherlands)
• In air beam line with 29 MeV/amu