Fabrication technology and packaging strategy for 300V-5A Silicon Carbide Schottky diodes with a wide temperature operation range capability (between -170ºC and 300ºC). These diodes have been designed for harsh environment space applications such as inner Solar System...
ASER diodes are increasingly used for space applications, either to pump solid state lasers, in photonic payloads, or as sources for LIDAR or spectrometric applications. In space applications reliability issues are a primary concern and among them, radiation hardness is one of...
Semiconductor lasers (or laser diodes) operating in the wavelength region of 1.8 µm to 3 µm are attractive light sources for applications including remote sensing, laser spectroscopy or pollutant detection. Highly strained InGaAs Quantum Wells (QW) grown on InP substrates can...
The Reliability Assessment of Area PIN SI Photodiodes was a exhibition theme in the First International Symposium on Reliability of Optoelectronics for Space that took place in Cagliari Italy , between May 11 – 14, 2009. INTA, the Instituto nacional de Técnica Aeroespacial in...
Conferences & Publications Innovation;
Collaboration with Industry and R&D centres Cooperation within optoelectronics business
Alter Technology has performed several R&D projects concerning characterization of EEE parts & subsystems at very extreme temperatures (-190ºC to 300ºC)
The cross-sectioning process provides access to the device internal structure, its materials and design. Such components as diodes and capacitors and silicon dice are often subjected to cross-sectioning to detect the defects which could not be found using other testing...
-Screening of a high number of devices under very harsh conditions: Custom testing setup -High Temperature: 270ºC -Low temp: -170ºC -High Voltage tests: 250V -High Power tests: 2.5A
CHARACTERIZATION OF RADIATION HARDENED SIC MOS STRUCTURES Key elements -Full characterization of several foundries comprising oxidation processing, packaging approach, etc. -To consolidate test methods and associated standards for SiC characterization
-Part to be provided as an ATN proprietary component -Large demand for TWTA applications -Unique parts with regard to a large reverse voltage, the highest operating temperature, low reverse current at high temperature and good switching performances at high frequency
