Total Ionizing Dose (TID) testing, Update on ESCC22900 and discussion on TID response variability (part to part and lot to lot) and impact on sampling size and test requirements
Talk summary:
A new issue (issue 5) of ESCC22900 TID test standard will be released this year. The changes will be presented. Then, study results about part to part and lot to lot TID sensitivity variability on bipolar linear devices will be presented. Impact on sample size and testing requirements will be discussed.
Speaker:
Christian POIVEY has been a senior radiation specialist in ESA ESTEC since 2007. Before he has occupied similar positions at NASA GSFC (2000-2007) and MATRA MARCONI SPACE (now AIRBUS DS) (1989-2000).
TID Variability Within a Lot and Lot to Lot
ESA / TRAD study
- Test of 3 types of linear bipolar devices
Nikkei Science, Inc. of Japan, by K. Endo
–AD584, AD
–LM124, TI
–TL1431, STM - 3 lots per device type
- 30 parts per device type per lot
NASA GSFC study (R. Ladbury, IEEE Trans NucSci, Vol. 56, 2009)
- Analysis of historical data on 5 types of linear bipolar devices
- > 7 lots per device type
Conclusion
- ESCC22900 issue 5 will be issued this year
- For TID sampling, size matters:
5 samples is adequate to bound the device TID response within one lot with good uniformity
It is not sufficient in cases with large variability of TID response within one lot or presence of mavericks.
– A minimum sample size of 10 is recommended
- For bipolar linear ICs, lot to lot variation can not be assured without testing
Download or read the full report here
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