Examples of part characterization
- Alter Technology has performed several R&D projects concerning characterization of EEE parts & subsystems at very extreme temperatures (-190ºC to 300ºC)
ASIC CQFP100 (-135 TO 90ºC)
BiCMOS TECHNOLOGY
ANALOG ACQUSITION & A/D CONV.
PHOTODIODE (-135 TO 105ºC)
SCHOTTKY DIODE (-170 TO 270ºC)
Range of technologies
- We have capabilities to perform characterization of all optical and electrical parameters of various electronic component families (electro-optical, ASIC, RF, Discrete) in order to assess their functioning in such conditions
Últimas entradas de Media ATN (ver todo)
- Inmunidad conducida - 20th mayo 2019
- Ensayos de Transitorios eléctricos - 2nd mayo 2019
- Ensayo Campo de RF radiado - 2nd mayo 2019