Optical & Electrical parameters; Characterization of SiC JFET & MOSFET; Prototyping and Characterisation of Radiation Hardened SIC MOS Structures; Photonic parts in Mars exploration related programmes;
New test methodologies: Combined Vacuum Temperature and Motion; Combined strain and extreme temperature; Combined radiation and cold temperature
Very Extreme temperature Testing Parts: Assessment of surrounding passive parts; Development of specific parts; Development of specific parts
Bakeout and very Extreme temperature Testing Facilities; The updated facilities comprises: 8 cryogenic chambers with a temperature range from -195ºC to +400ºC and ramps up to 40ºC/min. Dimensions up to 90x50x35cm.
This article describes the setup developments and some of the results obtained for the temperature characterization from -190ºC to more than +300ºC of passive components normally used for space missions, but with a standard operating temperature range in most of the cases. One...
Fabrication technology and packaging strategy for 300V-5A Silicon Carbide Schottky diodes with a wide temperature operation range capability (between -170ºC and 300ºC). These diodes have been designed for harsh environment space applications such as inner Solar System...
