Focused ion beam, also known as ion milling, is a technique used particularly in the semiconductor industry and materials science for site-specific analysis, deposition and ablation of materials. Since it is destructive to the part, FIB technology is used for micro-sectioning in...
Transfer business model to Harsh Environment Expand our capabilities within the space domain Assessment of the parts procurement approach for Cubesat applications Developing a full testing methodology for small satellites PCB assembly methods Packaging activities Developing...
Full design, manufacturing and evaluation of EM prototype for telecom applications The target is to replace current potentiometers by a more reliable appliance To provide a more attractive alternative to optical encoders Several customers (SENER, IAA, KayserThrede…) largely...
Access to SiC manufacturers (ACREO, INFINEON, SEMELAB, ST…..) -ATN as reference test house -To define NEW test methods to understand SiC performance
Examples of Projects: Radiative optoelectronic components vulnerability Britespace Photonic transceiver for secure space communications
-Screening of a high number of devices under very harsh conditions: Custom testing setup -High Temperature: 270ºC -Low temp: -170ºC -High Voltage tests: 250V -High Power tests: 2.5A
Access to SiC manufacturers (ACREO, INFINEON, SEMELAB, ST…..) -ATN as reference test house -To define NEW test methods to understand SiC performance
Britespace Specific projects Carbon and Climate Observation of Planet Earth: developing laser sources for the detection of greenhouse gases in future earth observation missions
Types (PM, POF, Single Mode, MM) Connectors AVIM FC/APC Splitters Switches Testing Temperature Cold Bending Pull and Rotation test Attenuation Wavelength range Rapid depressurization Radiation
Optical AmplifiersEDFA SOA Optical Modulators Litium Niobate Optical Switches WDM Programmable Optical Elements Liquid Crystals Thermopiles Filters Coatings
Materials (GaAs, AlGaAs, GaN,InGaP, InGaAs, InP…) Main Parameters peak wavelength threshold current slope efficiency temperature tuning coefficient current tuning coefficient PER
Alter Technology provides In house capabilities for complete characterization and environmental testing of any kind of photonic part including:
