Very Extreme temperature Testing Parts

Very Extreme temperature Testing

Assessment of surrounding passive parts

Silicon Capacitors – Development and Space Pre Evaluation

Full ESCC evaluation ID and HIF Sensitivity evaluation of SiC of Silicon capacitors including thermal characterization at > 200ºC.

• Reliability testing
• Endurance test
• Gamma and Heavy ions tests

Reliability testing of passive parts for very extreme temperature application

Upgrade of max. stress conditions for standard passive parts (capacitors and resistors including QPN and non QPL parts.

Key elements:  Developing of new technologies as well as new design considerations

Development of specific parts

SiC Schottky Blocking Diode for BepiColombo and Solar Orbiter

1200V Silicon Carbide diode

Qualification of parts assembly