Mari Angeles Jalón Victori
Test Developer
Trajectory
I received my B. Sc. Degree in Physics speciality in Electronic in 2001 from the University of Seville, Spain. In 2005 I received the Master of Advanced Studies in Microelectronics from the University of Seville, Spain. From 2003 to 2012 I was part of the Mixed-Signal group of the Institute of Microelectronics of Seville (IMSE) from the Spanish National Research Council. I am currently working as test developer in the Mixed-Signal area and finishing my Ph. Degree in Alter Technology, being my main area of interest the Analog-to-Digital Converters testing.
Alter Technology Services & Capabilities
Element Evaluation Procedure EEE Parts
The scope of Element Evaluation is to assess the reliability of a individual device to be used as add-on component in an hybrid assembly.
Element Evaluation cover electrical, physical and environmental (depending of required class level) performance of the add-on components to guarantee the space use of the tested devices.
Radiation Testing Services Electronics Parts
Radiation degrades EEE components and generates device perturbations that could lead to its malfunction or destruction. These effects are highly dependent on the radiation type: gamma radiation, heavy ions, protons, etc., but also on the device technology, the manufacturing lot and the working conditions.
Provides in-house radiation testing services which include test samples preparation, program and test board development.
ALTER TECHNOLOGY provides in-house radiation testing services which include test samples preparation, program and test board development as well as results reporting.
ELECTRICAL TESTING Electronic Components – Parts EEE
In-house capacity, capability and expertise to perform electrical screening of any type of electronic component technology.
For passive devices testing, we have equipment which permits the characterization of the electrical behavior of resistors, capacitors, coils, etc., in a wide range of test conditions and in accordance with their applicable specifications.
Engineering and testing of Hi Rel electronic components
High reliability electronic components - Space electronic components.
What Do We Offer to Our Customers?, comprehensive experience in the high reliability electronic components market,
Parts engineering expertise in product selection and design-in support
Technological evaluation and technology assessment
Manufacturer survey
Trade-off analysis
Testing capabilities for performing any kind of screening for high reliability applications
Direct contact between suppliers and customers, simplifying the product selection process, access to technical information and determining the proper procurement approach
Displacement Damage Testing
DISPLACEMENT DAMAGE Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. Displacement damage degrades minority carrier lifetime; a typical effect would be degradation of gain and leakage current in bipolar transistors. FIGURE: Principle of Displacement Damage Atomic displacement can occur mainly ballistically through kinetic energy transfer. As a charged particle […]
