In Alter Technology micro-sectioning is accomplished in a specifically dedicated laboratory and by ESA certified staff on PCB/SMD inspection. ESA selects those laboratories that according to the higher quality standards are recommended to perform such operations on SMT/PCB...
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XRF is a non-destructive and quick analytical tool to determine the chemical elements present in the specimen. In particular, it combines low detection limit (particularly in the case of heavy elements) with quick and easy sample preparation.
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This type of inspection is performed using an electron microscope which produces images of a sample by scanning it with a focused electron beam. Interaction between the electrons and atoms in the sample generates signals that contain information about the sample’s surface...
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This analytic technique may provide both qualitative and quantitative information of the composition of a surface, i.e. identification of the elements and the element weights, respectively. The technique relies on the detection and spectroscopy of secondary radiation (X-Ray)...