The use of radiation tools is justified as a complement of radiation test to verify and optimize the radiation hardness assurance process in the new space market and reduce some cost without a significant loss of the confidence level.
New failure modes not observed in Silicon appear while testing SiC MOSFET and Schottky diodes and under heavy ions radiation. Gate damage in transistors remains undetected even monitoring drain current and gate leakage of the transistor under high voltage biasing conditions.
Goal of the study • Propose a DD test standard • Should be available by the end of the year after ESA and Components Technology Board (CTB)/Radiation Working group (RWG) comments • Goal of this presentation ⇒ Not a draft of the future guidelines, but: • Remind the physical...
Electronics systems designed for applications in high radiation environments, such as space missions, high energy accelerators and avionics, are subject to a radiation qualification process at component level which is often time consuming and expensive. The new CERN High energy...
Laser beam brings unique capabilities for radiation hardness evaluation and testing of electronic components and systems. The presentation describes various laser techniques and approaches for radiation effects testing and research used in Russia by NRNU MEPhI and SPELS: SEE...
VA160 and VATA160 are used as front-end readout ASICs in the payloads of DAMPE. Both Laser pulse test and heavy ion beam test were conducted to get the SEL tolerance of the ASICs. Laser test was performed firstly to quality the SEL sensitivity because it is easy and ready at all...
Cryogenic Irradiation of a p-channel CCD at 153 K and Upcoming Irradiation Studies Cryogenic Irradiation of a p-channel CCD at 153 K and Upcoming Irradiation Studies. (Centre for Electronic Imaging, The Open University). Talk summary: A number of recent studies have shown that...
The radiation hardness of modern electronic devices regarding the space radiation environment is characterized according to two main aspects: cumulated effects and single event effects. The parts radiation qualification process includes Total Ionizing Dose (TID), Total Non...
In space applications, optocouplers may need to work at very low temperatures. Under this low temperature operating conditions, the device degradation subjected to radiation exposure may show different behaviour compared to a standard radiation test under room temperature. The...
ASER diodes are increasingly used for space applications, either to pump solid state lasers, in photonic payloads, or as sources for LIDAR or spectrometric applications. In space applications reliability issues are a primary concern and among them, radiation hardness is one of...
The Reliability Assessment of Area PIN SI Photodiodes was a exhibition theme in the First International Symposium on Reliability of Optoelectronics for Space that took place in Cagliari Italy , between May 11 – 14, 2009. INTA, the Instituto nacional de Técnica Aeroespacial in...
The Single event effects is becoming more and more important due to the devices technology evolution, the increase demand of COTS use (and other non characterized devices against radiation), and the radiation requirements request by new missions and applications. In this paper...
