28th Microelectronics Workshop in Japan.
| (Session Chair) Norio Nemoto S&MA / JAXA | |||
| 14:30 | Takashi Eishima | Axelspace | Return of Faster, Better and Cheaper : COTS Utilization in Small Sats |
| 15:20 | Agustin Coello-Vera | ALTER TECHNOLOGY TUV NORD | Using a Commercial Gyroscope in a Space Program |
Crimped connectors are extensively present in EEE systems because of the good performance and easier installation at reduced dimension. Due to the key role played, they are required to have high durability even under harsh operating conditions. In the case of unexpected/early failure, a thorough diagnosis and deep understanding of the main failure causes are the starting point to preclude future occurrence and improve the system reliability. Therefore, the present post gathers the main failure mechanisms in crimped connectors and indicates some the characterization tools used for the suitable failure analyses.
Improper degree of compression: Stress relaxation, Improper crimping, Diagnosis tools and Inspection conducted in Alter Technology laboratories.
Crimped connectors are gas-tight junctions ideally protected against environmental contaminants and corrosive agents. Nonetheless inappropriate crimping and inherent connector and wire defects reduce this protection. Thus, depending of the storage atmosphere, non-conducting corrosion products can be formed, or stress corrosion cracking can be eventually induced. The former act as insolation layer that reduces the connector conductivity and both corrosion effects are identified as critical factors involved in common fails reported for electrical connectors. Similarly, organic surface contamination at the contact interface forming and insulation or low resistance layer may also impair the system performance.
