Key elements: Developing new technologies and considering new designs Continue reading
-Screening of a high number of devices under very harsh conditions: Custom testing setup -High Temperature: 270ºC -Low temp: -170ºC -High Voltage tests: 250V -High Power tests: 2.5A Continue reading
CHARACTERIZATION OF RADIATION HARDENED SIC MOS STRUCTURES Key elements -Full characterization of several foundries comprising oxidation processing, packaging approach, etc. -To consolidate test methods and associated standards for SiC characterization Continue reading
-Part to be provided as an ATN proprietary component -Large demand for TWTA applications -Unique parts with regard to a large reverse voltage, the highest operating temperature, low reverse current at high temperature and good switching performances at high frequency Continue reading
Access to SiC manufacturers (ACREO, INFINEON, SEMELAB, ST…..) -ATN as reference test house -To define NEW test methods to understand SiC performance Continue reading
