Project: PROTOTYPING AND CHARACTERIZATION OF RADIATION HARDENED SIC MOS STRUCTURES
Customer: ESA (European Space Agency)
CHARACTERIZATION OF RADIATION HARDENED SIC MOS STRUCTURES
Key elements
- -Full characterization of several foundries comprising oxidation processing, packaging approach, etc.
- -To consolidate test methods and associated standards for SiC characterization
TID and HIF Sensitivity evaluation of SiC MOSFET body diodes
- Several Single Die MOSFETs packaged in DIL -> Heavy Ions Testing of several structures at the same time
- Different channel length and width in the same die for radiation sensitivity evaluation
- Different dice of several oxide types for oxide radiation sensitivity evaluation
- Body diodes to be packaged separately in suitable HV packages to allow HV under heavy ions testing
- Different epilayers used. Quality of epilayer evaluation
- Different raw materials: Evaluation of wafer quality and of its impact on radiation hardness
Últimas entradas de Demetrio Lopez (ver todo)
- Pruebas de Confiabilidad de Diodos Schottky SiC para Bepi Colombo - 1st febrero 2016
- Tecnologías Fotónicas en Aplicaciones Espaciales - 1st febrero 2016
- Evaluación de Componentes Optoelectrónicos para Aplicaciones Espaciales - 1st febrero 2016