Optical & Electrical parameters; Characterization of SiC JFET & MOSFET; Prototyping and Characterisation of Radiation Hardened SIC MOS Structures; Photonic parts in Mars exploration related programmes;
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The reliability of the components used in a spacecraft is a determinating factor for their operation and performance throughout the mission life. Only the most advanced techniques are able to provide the depth and accuracy in the inspections required by current state of the art...