The use of radiation tools is justified as a complement of radiation test to verify and optimize the radiation hardness assurance process in the new space market and reduce some cost without a significant loss of the confidence level. Continue reading
![](https://wpo-altertechnology.com/wp-content/uploads/2016/02/Reliability-testing-310x223.png)
Reliability testing of passive parts for very extreme temperature applications Continue reading
![](https://wpo-altertechnology.com/wp-content/uploads/2016/02/Reliability-testing-1-310x223.png)
Development of Silicon Capacitors for Space Applications Continue reading
![SiC Schottky Blocking Diode for Bepi Colombo](https://wpo-altertechnology.com/wp-content/uploads/2015/11/SiC-Schottky-Blocking-Diode-for-BepiColombo.jpg)
-Screening of a high number of devices under very harsh conditions: Custom testing setup -High Temperature: 270ºC -Low temp: -170ºC -High Voltage tests: 250V -High Power tests: 2.5A Continue reading
![CHARACTERISATION OF RADIATION HARDENED SIC MOS STRUCTURES](https://wpo-altertechnology.com/wp-content/uploads/2015/11/CHARACTERISATION-OF-RADIATION-HARDENED-SIC-MOS-STRUCTURES-image-310x232.jpg)
CHARACTERIZATION OF RADIATION HARDENED SIC MOS STRUCTURES Key elements -Full characterization of several foundries comprising oxidation processing, packaging approach, etc. -To consolidate test methods and associated standards for SiC characterization Continue reading
![Developing of 1200V SiC Diode](https://wpo-altertechnology.com/wp-content/uploads/2015/11/Developing-of-1200V-SiC-Diode-310x232.jpg)
-Part to be provided as an ATN proprietary component -Large demand for TWTA applications -Unique parts with regard to a large reverse voltage, the highest operating temperature, low reverse current at high temperature and good switching performances at high frequency Continue reading
![Characterization of SiC JFET MOSFET](https://wpo-altertechnology.com/wp-content/uploads/2015/11/Characterization-of-SiC-JFET-MOSFET-310x232.jpg)
Access to SiC manufacturers (ACREO, INFINEON, SEMELAB, ST…..) -ATN as reference test house -To define NEW test methods to understand SiC performance Continue reading