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  • alter technology madridEngineering and testing of Hi Rel Electronic Component
    • Radiation Testing Services Electronic Parts
    • COTS Commercial Off-The-Shelf | EEE Parts
    • Acceptance Tests
    • Counterfeit Detection, Authenticity Tests
    • Evaluation / Qualification
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    • Parts Engineering and Logistics – EEE Parts
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    • Relifing
    • Scanning Acoustic Microscopy C-SAM
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    • Tin Whiskers Growth
    • Vibration Testing | EEE Parts
    • Short Technical Notes – Discover how our laboratories work and how the components that need to be tested are treated.
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  • Evaluation / Qualification
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Raman Thermometry | Hi Rel Electronics Parts

by Francisco Javier Aparicio Rebollo

Raman thermometry is a thermal characterization technique which makes use of Raman scattering phenomena to determine the local temperature in microelectronics systems. Non-contact character. High spatial resolution (sub-micron scale). In-depth analysis within IR-transparent... Continue reading

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  • Evaluation / Qualification
  • Material Processes

IR Thermal Microscopy | Hi Rel Parts

by Francisco Javier Aparicio Rebollo

IR thermal microscopy (or infrared radiation thermometry) analyses the spatial distribution of the emitted infrared radiation either over the device surface or eventually inside the inspected device. This technique enables us to obtain 2D temperature maps, which are used to... Continue reading

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  • Evaluation / Qualification
  • Material Processes

XPS: X-Ray Photoemission Spectroscopy | EEE Parts

by Francisco Javier Aparicio Rebollo

X-ray photoemission spectroscopy (XPS) also known as electron spectroscopy for chemical analysis (ESCA) is a surface-sensitive quantitative analysis method to accurately determine the elemental composition of solid materials. The technique is the most extended tool for the... Continue reading

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  • Electrical testing
  • Evaluation / Qualification
  • Failure analysis
  • Material Processes

XRF: X-Ray Fluorescence Spectroscopy | Hi Rel Parts

by Francisco Javier Aparicio Rebollo

XRF is a non-destructive and quick analytical tool to determine the chemical elements present in the specimen. In particular, it combines low detection limit (particularly in the case of heavy elements) with quick and easy sample preparation. Continue reading

Microsectioning analysis of PCB systems.
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  • Material Processes
  • Microsectioning

Microsectioning Analysis of PCB Systems | EEE Parts

by MC Lopez

Microsectioning and materialographic inspection are mandatory in different verification and qualification standards issued by international agencies and public bodies such as the European Space Agency (ESA), the Defense and Logistics Agency (MIL DLA specifications) and the IPC... Continue reading

Tin Whisker Growth Results
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  • Tin Whiskers Growth

Tin Whisker Growth Results

by Dimas Morilla

Tin Whisker Growth Results comes after the investigations and thanks to the methods carried out by Alter Technology, we can reach some conclusions. An important starting point must be stressed that NONE OF THE “AS RECEIVED” SMD DEVICES POSSESSED WHISKERS. It was confirmed by... Continue reading

Tin Whisker Growth Conclusions
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  • Tin Whiskers Growth

Tin Whisker Growth Conclusions

by Dimas Morilla

This study corroborates that the Nickel (Ni) underlayer recommended by the industry as a diffusion protective barrier of the contact, is effective in delaying Stannum (Sn) whisker growth under ambient temperature/humidity storage conditions or during temperature cycling. Continue reading

space solar cells
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  • Evaluation / Qualification
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SOLAR CELLS

by José Cándido Vázquez Cárdeno

The new century brought to the space a new type of solar cells with higher efficiencies and better resistance to radiation damage such as those based on the III-V single-junction GaAs. This new material opened the possibility of further improvement by the development of the... Continue reading

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  • Evaluation / Qualification
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Thermoreflectance Thermal Imaging | Hi Rel Electronics Parts

by Media ATN

Submicrometric-nanometric objects nowadays present in the design of integrated circuits induce singular heat transport phenomena leading to the formation of hot-spots or strong temperature gradients at specific local points, which compromises the suitable operation and... Continue reading

Tin Whisker Growth Experimental Methods
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  • Tin Whiskers Growth

Tin Whisker Growth Experimental Methods

by Dimas Morilla

The surface mount device beads under study have two rectangular contacts at opposite sides. With bends of 90 degrees that have an approximate planar surface of 3.048 mm2 each. In order to comply with the standard JESD22-A121, 12 leads on at least 6 components must be examined... Continue reading

Tin whisker growth on surface mount devices: a study using standarized test conditions
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  • Tin Whiskers Growth

Tin Whisker Growth

by Dimas Morilla

The Tin Whisker is a conductive hairy-like crystalline structures of tin that grow spontaneously from a tinned surface, usually as a result of stress of some sort, and maybe long enough to cause a big problem for those applications demanding high level of reliability. In this... Continue reading

Balanced-to-Balanced Microstrip Diplexer Based on Magnetically Coupled Resonators
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  • Microwave & RF testing
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Balanced-to-Balanced Microstrip Diplexer Based on Magnetically Coupled Resonators

by Aintzane Lujambio Genua

The use of differential (or balanced) digital and analog circuits for information processing has increased in recent years . When transmitting high-speed electrical signals, both the electromagnetic (EM) fields generated by the transmitted signals and the ground plane return... Continue reading

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