Procurement Electronic Components

Procurement EEE Parts

Fully compliant with the project requirements Our commercial and technical expertise and experience allows us to recommend, select and supply components from good manufacturing sources (avoiding counterfeits). All EEE parts procured by us are fully inspected and tested to ensure... Continue reading

Life Test

The objective of life testing is to evaluate whether failures caused by wear-out are likely to occur during the product lifetime and thus to estimate compliance of the device with the long-term reliability requirements. Continue reading

helios nanolab

Scanning Electron Microscope SEM – FIB Inspections Focused Ion Beam

This type of inspection is performed using an electron microscope which produces images of a sample by scanning it with a focused electron beam. Interaction between the electrons and atoms in the sample generates signals that contain information about the sample’s surface... Continue reading

3D-X Ray inspection

Radiographic Inspection 3D X Ray – 2D

Radiographic Inspection 3D X Ray – 2D The purpose of radiographic inspection is to detect internal physical defects which are not otherwise visible in electronic components. The radiographic techniques reveal  such flaws as presence of foreign objects, improper... Continue reading