To study and predict radiation induced degradation of optoelectronic devices, with particular interest in image sensors based on APS (active pixel sensing) technology, as well as of InGaN, GaP and AlInGaP semiconductor materials.
Latest posts by Media ATN (see all)
- Conducted Immunity - 20th May 2019
- Electrical transients Test - 2nd May 2019
- RF radiation field Test - 2nd May 2019
This post is also available in: Spanish