Digital Hi-speed 65 nm Test Vehicle for TID radiation test Hirex Engineering
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The two diffusion lots under TID testing behave the same. They are homogenous which confirms there is no process
No functional failure observed during the test and after annealing.
IOs (LVDS, BIDIR and I2C): No drift out of specification was observed up to 300 krads (Si). Cold Sparing far below 100 nA max specification. Cold spare LVDS IO operates at 2.5V up to 650 Mbps.
Lock time measurements: An increase lower than 1% was observed on this parameter. The worst case “Lock time” drift was observed on one biased sample with a time lock decrease of maximum 4%,
i.e. from 38.1μs to 36.9μs after 300 krads (Si).
Total Jitter measurements: No drift out of specification was observed up to 300 krads (Si). An increase of maximum 2% was observed on this parameter. The worst case drift was observed on biased samples with a total jitter increase of 8% from 306ps to 322ps.
Overall the PLL1201 is fully immune to TID at the maximum cumulated dose, here set to 300 krads (Si).
Frederic Tilhac obtain his Ph. D. in Electronic, Electrothecnic and Automation in 1988. Hirex Engineering .