Emulation and failure injection, a complement to Radiation Test

Emulation and failure injection, a complement to Radiation Testing

Talk summary:
Accelerators are the accepted method to validate a device to flight. In vivo testing is a complex
and expensive task that is needed to get information about how failures can propagate to
primary outputs and monitor that the response of a design is correct.
There is a strong dependence between the design and test stimuli and the number of errors
collected in a test of a complex circuit.
Fault Injection is an inexpensive technique that during design time, refine the design for the
test fixture, improve the quality of stimuli, in order to maximize the error rate, and test the
design observability.
The talk will present a practical tool useful for the design behavior prediction, in order to help
to develop a good mitigation scheme and to develop a good test plan. This tool is also suitable
to develop test plan for FPGAs

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radiation testing particle hitting

Speaker:

Miguel A. Aguirre is a Professor in the area of Electronic Technology in the Universidad de
Sevilla, in the Escuela Técnica Superior de Ingeniería. He has leaded at least five projects in the
Spanish research plan and four European framework projects. He has addressed three PhD
dissertation related to radiation testing. The research group headed by Prof. Aguirre has
developed the fault injection system used by ESA called FT-UNSHADES2 and its analog version
called AFTU.