material analysis electronic component

Material Analysis EEE Components

Material Analysis is performed to detect and identify the materials used in the manufacturing of semiconductors and microelectronic parts and packages. One particular use of this analysis is the detection of prohibited materials, especially in the lead finish, to identify... Continue reading

External Visual Inspection

External Visual Inspection Consists in a non-destructive optical inspection. Binoculars with magnification between 1x and 60x and with a relatively large and accessible field of view are employed for this purpose. FIGURE: External visual inspection at ALTER Technology The aim of... Continue reading