Project: Prototyping and Characterization of Radiation Hardened SIC MOS Structures
Customer: ESA (European Space Agency)
Characterization of Radiation Hardened SIC MOS Structures
Key elements
- -Full characterization of several foundries comprising oxidation processing, packaging approach, etc.
- -To consolidate test methods and associated standards for SiC characterization
TID and HIF Sensitivity evaluation of SiC MOSFET body diodes
- Several Single Die MOSFETs packaged in DIL -> Heavy Ions Testing of several structures at the same time
- Different channel length and width in the same die for radiation sensitivity evaluation
- Different dice of several oxide types for oxide radiation sensitivity evaluation
- Body diodes to be packaged separately in suitable HV packages to allow HV under heavy ions testing
- Different epilayers used. Quality of epilayer evaluation
- Different raw materials: Evaluation of wafer quality and of its impact on radiation hardness
Latest posts by Demetrio Lopez (see all)
- Electronic components for motor vehicles: the solution in New Space? - 13th September 2019
- Assembly, Integration & Testing in Small Satellites - 2nd August 2019
- Design in Small Satellites - 2nd August 2019