Design of printed circuits and integration of test systems.
It is easy to understand that the high performance offered by new electronic devices demand test environments with even superior features that allow measurements without introducing “artifacts” that may affect the results. This process is becoming a challenge, especially when we take the technology to limits of frequency, speed, volume of data, etc.
To achieve this goal, and ensure test operations, tasks must be developed in different areas, from electronic design, electrical simulations, PCB design, …, etc., to the selection and evaluation of the most appropriate technologies and techniques. of associated integration to be able to perform valid measurements required for certain test applications: RF devices, high-performance integrated circuits, …, etc.