Microsection study will be present at the EMPS

Alter Technology will participate at the 10th EMPS (Electronics Materials & Processes for Space Workshops)

presenting “Influence of assembly methods and thermal cycling on MLCC capacitors on crack appearance. Microsection study.”. 

How the authors are proposing, we are pleased to present the abstract as follow:

GDE Error: Unable to load requested profile.

[simple-author-box]

MC Lopez